Many electronic components fail within the first hours of operation due to manufacturing defects, weak bond wires, or marginal semiconductors. These early failures, known as infant mortality, are catastrophic for critical systems—which is why burn-in testing exists.
For medical devices, automotive systems, and industrial controls, one infant-mortality failure can mean recalls, downtime, and reputational damage. Burn-in screening, often combined with environmental stress testing and counterfeit detection, shifts failures from the field to the test floor—where they are cheap and safe to find.
Disclaimer: This content is for informational purposes only. Burn-in profiles depend on component type and application; consult a electronics testing lab Shenzhen laboratory for appropriate screening parameters.